HV GaN reliability and status

Abstract

In this paper the reliability requirements to qualify High Voltage (HV) GaN technologies are discussed. A multi-faceted methodology that is derived from the target application profile is used to assure that the device will perform reliably for the specified lifetime in the field. Whether the qualification requirements of GaN technology need to exceed the standard JEDEC requirements or not depends on the activation energies and acceleration factors of the degradation mechanisms associated with a given technology, as well as the target application profile. The discussion in this paper addresses the topic of qualifying GaN technologies and the need for a comprehensive approach to reliability assessment that might exceed the JEDEC standards.