Ultramicroscopy · 2015 · 60 citations · 28 references
EngineeringMaterials EngineeringMaterials ScienceInstrumentationMetrologyOpticsDefect CharacterizationElectron MicroscopyScanning TechniquesSpecimen PreparationSpecimen ProcessingTransmission Electron MicroscopyQuantitative Transmission Electron MicroscopyScanning Electron Microscope MetrologyScanning Electron MicroscopyScanning Electron Microscopy AnalysisScanning Transmission Electron Microscopy
28
Standardless Atom Counting in Scanning Transmission Electron Microscopy
James M. LeBeau, Scott D. Findlay, Leslie J. Allen et al. · Nano Letters · 2010 · 227 citations