Quantitative mechanical property mapping at the nanoscale with PeakForce QNM

Abstract

1has long been recognized as a useful tool for measuring mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by SPM researchers. A number of recent SPM mode innovations have taken aim at these limitations, and now, with the release of PeakForce QNM™ by Veeco, it is possible to identify material variations unambiguously and at high resolution