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Estimation of genetic parameters related to morpho-agronomic traits of Durum Wheat (Triticum turgidum var. durum)

39

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12

References

2010

Year

Abstract

Grain yield is a complex trait and is greatly influenced by various environmental conditions. A 2-year field investigation was carried out to estimate genetic parameters and relationship among morpho-agronomic traits studied on 12 advanced durum wheat and two checks under rainfed conditions. The investigated variables included the grain yield (YLD), plant height (PH), number of tiller per plant (NT), peduncle length (PL), flag length (FL), leaf dry weight (LDW), stem dry weight (STW), spike dry weight (SPW), spike height (SH), leaf area index (LAI), crop growth rate (CGR), relative growth rate (RGR), leaf area ratio (LAR) and net assimilation rate (NAR). Combined variance analysis showed a significant variation among genotypes for the traits PH, NT, PL, FL, LDW, STW, SPW, SH, LAR and NAR. High correlations were found among the PL, LDW, STW, SPW, LAR and NAR. Heritability was high for PH, PL, LDW, STW and NAR. High genetic gains were observed for YLD, NT, PL, LDW, STW, SPW, LAR and NAR. The effects of year and year × genotype showed non-significant effects.

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