Probing beneath the surface without a scratch — Bulk non-destructive elemental analysis using negative muons - Concepedia

Concepedia

Publication | Closed Access

Probing beneath the surface without a scratch — Bulk non-destructive elemental analysis using negative muons

36

Citations

9

References

2015

Year

A. D. Hillier, D. McK. Paul, K. Ishida

Microchemical Journal

Materials ScienceSurface CharacterizationEngineeringPhysicsMicroscopyNatural SciencesSpectroscopySurface ScienceApplied PhysicsScanning Probe MicroscopySurface AnalysisMicroanalysisNegative Muons

References

	Year	Citations

Page 1