Near-field scanning for EM emission characterization

Jun Fan

IEEE Electromagnetic Compatibility Magazine · 2015 · 32 citations · 25 references

Concepts

Abstract

This tutorial reviews a few important issues when using the near-field scanning technique for EM emission characterization. Calibration of field probes is introduced first to eliminate or reduce the errors in the measurement of EM field components. Then, methodologies to obtain the phase information in near-field scanning are discussed. For characterizing radiators in free space in terms of far-field emissions, different Near-Field Far-Field Transformation algorithms are introduced. Finally, radiated-emission models based on near-field scanning are presented for characterizing the radiators in a complex environment/system, and an example on interference estimation demonstrates the application of such models.

References

25