IEEE MTT-S International Microwave Symposium digest · 2003 · 25 citations · 6 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsInstrumentationThin FilmsDevice CharacterizationDielectric PropertiesDielectric ResponseDielectricsSuperconducting MaterialsSuperconducting Thin FilmsDielectric CharacterizationDielectric MeasurementHigh-temperature Superconducting FilmsHigh-temperature SuperconductorsNondestructive TestingSuperconducting PropertiesSuperconducting ResonatorsThin-film Superconductors
A novel probe for high-T/sub c/ superconductor measurements based on the post dielectric resonator is described. Advantages of the device and the method of measurements include high sensitivity, simplicity, ability to measure small superconductor samples, and nondestructive measurements of selected areas of larger samples including thin-film superconductors. The technique and selected results are presented.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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