Concepedia

Structure-Property Correlation in Low K Dielectric Materials

Michael Morgen, Jie-Hua Zhao, Michael F. Hay, Taiheui Cho, Paul S. Ho

MRS Proceedings · 1999 · 13 citations · 12 references

DOI

Concepts

References

12

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

, , +13

Additivity methods in molecular polarizability

Kenneth J. Miller · Journal of the American Chemical Society · 1990 · 814 citations

, , +7

Ellipsometry and polarized light

H.G. Jerrard · Optics & Laser Technology · 1978 · 748 citations

, , +9

Mechanical properties of SiO<sub>2</sub>aerogels

Gudrun Reichenauer, J. Fricke · Journal of Physics D Applied Physics · 1988 · 144 citations

, , +8

Ultrasonic velocity measurements in silica, carbon and organic aerogels

J. Fricke · Journal of Non-Crystalline Solids · 1992 · 136 citations

, , +14