IEEE Journal of Solid-State Circuits · 2013 · 104 citations · 21 references
EngineeringElectrical EngineeringLow-power DesignMicroelectronicsPower ElectronicsChip PackagingCmos Circuit DesignConverter TopologiesIntegrated Circuit DesignIntegrated Circuit DevicesRadio-frequency Integrated CircuitsBuck Ac-dc ConvertersBuck ConvertersCapacitorsCurrent DensityFlying Capacitor ConvertersInductor DesignParasitic Capacitance ReductionParasitic Inductance Effects
In today's fully-integrated converters, the integrated LC components dominate the chip-area and have become the major limitation of reducing the cost and increasing the current density. This paper presents a 100 MHz four-phase fully-integrated buck converter with standard package bondwire inductors and a flying capacitor (C <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">FLY</sub> ) topology for chip-area reduction, occupying 1.25 mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> effective area in 0.13-μm CMOS technology. A four-phase operation is introduced for chip-area reduction with the cost penalty minimized by utilizing standard package bondwire inductance as power inductors. Meanwhile, an extra more than 40% chip-area saving is achieved by the simple but effective C <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">FLY</sub> topology to take advantage of the parasitic bondwire inductance at the input for ripple attenuation. A maximum output current of 1.2 A is obtained by the four-phase operation, while only 3.73 nF overall integrated capacitors are required. Also, with the chip-area hungry integrated spiral metal inductors eliminated, the current density is significantly increased. 0.96 A/mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> current density and 82.4% efficiency is obtained with 1.2 V to 0.9 V voltage conversion without using any off-chip inductors or advanced processes. The reliability is also verified by measurement with various bondwire inductances and configurations.
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