Physical Review · 1967 · 811 citations · 8 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSemiconductor MaterialsThin FilmsElectrical ConductivityMetal-semiconductor ContactsSemiconductor PhysicsSemiconductor Thin FilmsSurface PhysicsThin Film Electrical PropertiesBulk ConductivityBulk Electrical ConductivityConductivityConductivity In Thin FilmsElectrical Transport PropertiesPhysical PropertiesSchottky ContactsTraps
Existing experimental data on the bulk conductivity of ${\mathrm{Ta}}_{2}$${\mathrm{O}}_{5}$ and SiO films are shown to be consistent with the Schottky effect rather than the Poole-Frenkel effect. A discussion of the physical properties of vacuum-deposited insulators has led to a simple model in which the insulator is proposed to contain neutral traps and donor centers. This model is shown to resolve the above-mentioned "anomalous" Poole-Frenkel effect. Other simple models are discussed, but they do not exhibit the anomalous Poole-Frenkel effect.
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J. M. Bailey · American Journal of Physics · 1965 · 281 citations
Electron Transport Mechanisms in Thin Insulating Films
Carver Mead · Physical Review · 1962 · 280 citations
Electrical Conduction through SiO Films
Thomas E. Hartman, J.C. Blair, R. S. Bauer · Journal of Applied Physics · 1966 · 131 citations