IEEE Transactions on Electron Devices · 2007 · 11 citations · 11 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesThin FilmsField-effect TransistorsMemory DevicesSemiconductor Device MaterialsSemiconductor Thin FilmsThin-film MaterialsThin-film TransistorsCurrent ControlMemory Circuit DesignMemory MaterialsNonvolatile MemoryNonvolatile Memory DevicesPhase-change MemorySilicon
We prototyped phase-change (PC) channel transistors and demonstrated two functions of nonvolatile memory and channel current control. We have developed prototype transistors that use a PC channel instead of a silicon channel. The PC material of a Ge <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> Sb <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> Te <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5</sub> thin film with a thickness of 50 nm was used. We demonstrated a memory function whereby we achieved a reversible change between the crystalline and amorphous phases by applying a source-drain (SD) voltage for Joule heating. In the experiment, the applied voltages for PC between amorphous and crystalline phases were from 5 to 8 V. Control of the channel current was realized by applying a gate bias. The SD current was suppressed to less than 1/20 of that at a gate bias of -3 V by applying a gate bias of 0-3 V
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Room-temperature single-electron memory
Kazuo Yano, T. Ishii, T. Hashimoto et al. · IEEE Transactions on Electron Devices · 1994 · 434 citations
Engineering, Computer Engineering, Electrical Engineering +15