Publication | Closed Access
Radiation testing results of COTS based space microcircuits
16
Citations
4
References
2002
Year
Unknown Venue
Space Environment TestingRadiation TestingSpace MicrocircuitsTotal Ionizing DoseEngineeringPhysicsSpace EnvironmentHeavy Ion PhysicSingle Event EffectsCandidate Spacecraft MicroelectronicsCosmic RayInstrumentationIon EmissionMedicineRadiation OncologySpace Electronics Inc.DosimetryRadiation Protection
We present both heavy ion single event effect (SEE) and total ionizing dose (TID) data collected at Space Electronics Inc. for candidate spacecraft microelectronics.
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