Model construction and parameter effect for TFT-LCD process based on yield analysis by using ANNs and stepwise regression - Concepedia

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Model construction and parameter effect for TFT-LCD process based on yield analysis by using ANNs and stepwise regression

22

Citations

9

References

2006

Year

Kun‐Lin Hsieh, Yen-Sheng Lu

Expert Systems with Applications

Parameter EffectEngineeringTft-lcd ProcessDisplay TechnologyIndustrial EngineeringSystems EngineeringYield OptimizationYield Analysis

References

	Year	Citations

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