IEEE Transactions on Instrumentation and Measurement · 2008 · 12 citations · 13 references
EngineeringElectrical EngineeringInstrumentationMicroelectronicsMicrowave EngineeringDevice CharacterizationMicrowave MeasurementsMicrowave Noise AnalysisNoiseNoise In Electronic DevicesNoise MeasurementMicrowave Noise CharacterizationNoise AnalysisNoise CharacterizationNoise Measurement TechniquesNoise Parameter ExtractionNoise ParametersNoise Spectral AnalysisOn-wafer Measurement Techniques
A new on-wafer noise parameter measurement method at a 2.8-18-GHz frequency band is presented. This measurement method is based on both temporal and spectral analysis of noise power measurements. We present the method and the experimental results on an active two-port. It requires less equipment than the classic noise parameter measurement method. It gives direct results for 801 points in the 2.8-18-GHz frequency band.
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Horst Rothe, Walter E. Dahlke · Proceedings of the IRE · 1956 · 417 citations
The determination of device noise parameters
Richard Q. Lane · Proceedings of the IEEE · 1969 · 275 citations
Engineering, Computer Engineering, Electrical Engineering +16