Powder Diffraction · 1990 · 24 citations · 3 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsMaterials CharacterizationPhysical ChemistryMicrostructure AnalysisPhase AnalysisPhase IdentificationSilicon MaterialsX-ray CrystallographyX-ray DiffractionCalibration Curve AnalysisPhase DeterminationPhase QuantificationQuantitative Phase AnalysisSiliconSilicon CharacterizationSilicon NitrideX-ray Diffraction Phase Analysis
Abstract The relative intensities ratios for the determination of the relative amounts of alpha and beta phases in silicon nitride and the relative amounts of delta yttrium disilicate (Y 2 Si 2 O 7 ) and nitrogen apatite [Y 5 (SiO 4 ) 3 N] are reported. These constants were determined using an iterative method applicable when the pure phases are not easily prepared. In addition, a calibration curve was obtained for the quantitative measurement of free silicon in silicon nitride over the range 0 to 0.3% by weight of Si.
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RIR - Measurement and Use in Quantitative XRD
C. R. Hubbard, Robert L. Snyder · Powder Diffraction · 1988 · 580 citations · Full text