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Nanostructure of thin silicon films by combining HRTEM, XRD and Raman spectroscopy measurements and the implication to the optical properties

Materials ScienceOptical MaterialsEngineeringRaman Spectroscopy MeasurementsNanomaterialsOptical PropertiesNanotechnologySurface-enhanced Raman ScatteringApplied PhysicsNanometrologyThin FilmsSilicon On InsulatorThin Silicon FilmsThin Film Processing