Sub-Microsecond RF MEMS Switched Capacitors

Abstract

This paper presents fast switching RF microelectromechanical systems (MEMS) capacitors with measured switching times between 150-400 ns. By introducing bent sides on a planar microbeam, it is shown experimentally that the resonance frequency of aluminum bridges is increased by a factor of 25 compared to standard RF MEMS components. In addition, this original shape can be implemented easily in post-processing of complementary metal-oxide-semiconductor circuits. Several designs are presented with measured mechanical resonance frequencies between 1-3 MHz and measured switching times under 400 ns. Using this original approach, sub-microsecond RF MEMS switched capacitors have been designed and fabricated on quartz substrate. Their resulting RF performance is presented with a measured capacitance ratio of 2.3. Reliability tests have also been performed and have demonstrated no significant mechanical behavior variation over 14 billion cycles and a moderate sensitivity to temperature variation.