CGIN: a fault tolerant modified Gamma interconnection network

Abstract

To improve the terminal reliability of the Gamma interconnection network (GIN), we consider altering its connecting patterns between stages to attain multiple disjoint paths between any source and destination pair. The new modified GIN, referred to as a CGIN with connecting patterns between stages exhibiting a cyclic feature, is able to tolerate any arbitrary single fault and to lift up terminal reliability accordingly. If several rows of switching elements are fabricated in one chip using the VLSI technology, a CGIN could lead to reduced cost because the pin count per chip decreases and the layout area taken by connections shrinks. To make routing and rerouting in the CGIN more efficient and simpler to implement, destination tag routing and rerouting is also provided.