Fault detection effectiveness of weighted random patterns

Abstract

Performance results are given for use of a weighted random pattern test generator, WRP, on ten benchmark designs. Deterministic (DET) and WRP tests created for single stuck faults are compared in their ability to detect shorts and transition faults. The WRP is able to generate a test for all the single stuck faults detected with a state-of-the-art deterministic pattern generator; WRP is highly efficient in CPU time required for full stuck fault test pattern generation; both DET and WRP achieved high net-to-net shorts fault coverage on a sample of ten designs; and WRP had significantly higher ( approximately=11%) transition fault coverage than obtained with DET for the same sample.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>