IEEE Transactions on Instrumentation and Measurement · 2003 · 58 citations · 1 references
Natural SciencesElectrical EngineeringMaterials ScienceElectrochemistryMaterials CharacterizationMetrologyElectrical CharacterizationElectrical ConductivityElectrical MeasurementElectrical MetrologyConductivityConductivity MeasurementConductivity Measurement TechniquesElectrical Conductivity MeasurementsResistivity Measurement
A new methodology for conductivity measurements, where square metallic samples are measured with the Van der Pauw technique, has been successfully implemented. The uncertainty obtained is 0.04% and a comparison between national metrology institutes gives an agreement of the measurement values within 0.035%. Major advantages of the new method are that smaller reference samples are required and only a single dimensional measurement is needed.
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