Applied Physics Letters · 2008 · 28 citations · 5 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesDevice ModelingEtching ProcessesLaser DiodesLaser PhysicsLight-emitting DiodesSemiconductor LasersCharge Carrier DensityCurrent Injection EfficiencyPower ConversionPower Conversion EfficiencyPower EfficiencySemiconductor Laser DiodesSpontaneous EmissionThreshold Behavior
Etching microstructures into broad area diode lasers is found to lead to more uniform near field and increased power conversion efficiency, arising from increased slope. Self-consistent device simulation indicates that this improvement is due to an increase in the effective internal injection efficiency above threshold—the nonuniform near field leads to regions of inefficient clamping of the carrier density in the laser stripe. Measurements of spontaneous emission through the substrate confirm the predicted carrier profile. Both experiment and theory show that improved overlap between carrier and power distributions correlates with improved slope.
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P. Crump, Weimin Dong, Mike Grimshaw et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 52 citations