Cavity ringdown detection of losses in thin films in the telecommunication wavelength window

Abstract

The method of cavity ringdown spectroscopy (when a tunable pulsed optical parametric oscillator was used) was extended for the loss evaluation in thin films (2-20-microm thickness). The technique was applied in two key telecommunication wavelength ranges of 1260-1330 and 1480-1650 nm. The measurement sensitivity was determined to be 50 ppm (5 x 10(-5)). The results for polymer films are in close correlation with conventional spectrophotometric data and propagation loss for planar waveguides. Films of greater thickness and better optical quality are expected to provide an even higher loss resolution.