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Method for Cross-sectional Transmission Electron Microscopy Specimen Preparation of Composite Materials Using a Dedicated Focused Ion Beam System
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1999
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Ga Implantation RateEngineeringMicroscopyIon Beam InstrumentationIon ImplantationElectron MicroscopyIon BeamInstrumentationTransmission Electron MicroscopeMaterials ScienceMaterials EngineeringCrystalline DefectsFocused Ion BeamMicrostructureIon Beam SystemComposite MaterialsMaterials CharacterizationApplied PhysicsElectron Microscope
: A new method for transmission electron microscope (TEM) specimen preparation using a focused ion beam (FIB) system that results in a lower rate of gallium (Ga) implantation has been developed. The method was applied to structural and analytical studies of composite materials such as silicon (Si)-devices and magneto-optical disk. To protect the specimens against Ga ion irradiation, amorphous tungsten (W) was deposited on the surface of the specimen prior to FIB milling. The deposition was quite effective in reducing the Ga implantation rate, and energy-dispersive X-ray (EDX) analysis of these specimens detected 0.3-1.5% Ga incorporated in the thinned area. FIB milling times for these specimens were 1.5-2 hr, with a starting thickness of about 50 µm. Although the milling rate was high, all the materials were properly prepared for TEM study, and clear crystal lattice images were observed on all specimens.