Performance of sputtered SiO <sub>2</sub> film as acoustic antireflection coating at sapphire/water interface

Jun‐ichi Kushibiki, T. Sannomiya, Noriyoshi Chubachi

Electronics Letters · 1980 · 13 citations · 3 references

Abstract

The effect of sputtered SiO2 films as an acoustic antireflection coating for matching the large acoustic discontinuity at the sapphire/water interface is experimentally and theoretically investigated in a frequency range of 200 to 1100 MHz. By the introduction of SiO2 films, the transmission loss of more than 9 dB at the interface is reduced to less than 1 dB at a quarter-wavelength frequency of SiO2 film with high reproducibility.

References

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