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On-line monitoring of the MOSFET device junction temperature by computation of the threshold voltage
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2006
Year
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EngineeringRegular CalibrationSemiconductor DeviceOn-line MonitoringCalibrationThermal AnalysisThermal ModelingThermodynamicsInstrumentationDevice ModelingElectrical EngineeringPower MosfetReal-time Thermal ModelBias Temperature InstabilityThreshold VoltageComputer EngineeringHeat TransferMicroelectronicsTemperature MeasurementThermal SensorThermal Engineering
A method for an on-line junction temperature measurement is introduced. The circuit allows the calibration of a real-time thermal model of a power MOSFET. A regular calibration of the real-time model provides an accurate thermal flux model over the lifetime of the power MOSFET. The measurement of threshold voltage is used to determine the device temperature. The paper presents the on-line measurement method, the circuit and test results.