Journal of Applied Crystallography · 1999 · 1.3K citations · 13 references
Natural SciencesChemistryMaterials ScienceCrystal StructureMaterials CharacterizationMaterials ChemistryCrystal ChemistryCrystal LatticeCrystallographyStructure DeterminationX-ray CrystallographyX-ray DiffractionCrystal Structure AnalysisDiffraction Pattern AnalysisDiffraction PatternsLattice ModelsLattice ParametersPowder DiffractionPowder Diffraction AnalysisRietveld Analysis
Anisotropic line-shape broadening (peak width which is not a smooth function of d -spacing) is frequently observed in powder diffraction patterns, and can be a source of considerable difficulty for whole-pattern fitting or Rietveld analysis. A model of the multi-dimensional distribution of lattice metrics within a powder sample is developed, leading naturally to a few parameters which can be varied to achieve optimal line-shape fits. Conditions on these parameters are derived for all crystal systems, and the method is illustrated with two examples: sodium p -hydroxybenzoate and rubidium fulleride.
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R. A. Young · 1993 · 2.6K citations
Natural Sciences, Materials Engineering, Materials Science +15
Mathematical Statistics with Applications
Gary E. Meek, William M. Mendenhall, Richard L. Scheaffer et al. · Technometrics · 1987 · 1.3K citations