Journal of Lightwave Technology · 1992 · 46 citations · 22 references
Natural SciencesMaterials SciencePhysicsOptical MaterialsOptoelectronicsPhotonicsNonlinear Optical MaterialsNonlinear OpticsOptical WaveguidesPropagation ModelingRefractive IndexWaveguidesAnnealingAnnealing Time EffectsChannel WaveguidesDepth Profile AnalysisMode PropagationPlanar WaveguidesRefractive Index DispersionWaveguide Modes
A thorough and detailed characterization of annealed proton-exchanged (APE) waveguides in Z-cut LiNbO/sub 3/ is described. The mode index measurements in planar waveguides as a function of wavelength and annealing time are reported, including useful analytical relations for the refractive index change, its dispersion, and the depth profile as a function of annealing parameters. Analytical expressions for the mode propagation characteristics are presented and experimentally verified with reasonable accuracy. It is shown that the planar waveguide characterization results can be used to model the channel waveguide characteristics accurately. The model provides closed-form expressions for the mode index and the mode field profile, and the theoretical results are in excellent agreement with the measured data. The technique is used to accurately predict the phase mismatch between the fundamental and second harmonic modes in frequency-doubling experiments using APE channel waveguides. An optimum waveguide geometry for which the phase mismatch is relatively insensitive to the waveguide nonuniformity was predicted and verified experimentally.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Scaling Rules for Thin-Film Optical Waveguides
H. Kogelnik, V. Ramaswamy · Applied Optics · 1974 · 277 citations
Natural Sciences, Electrical Engineering, Materials Science +13