Concepedia

Publication | Closed Access

Characterization of thin-film amorphous semiconductors using spectroscopic ellipsometry

DOI

159

Citations

16

References

2000

Year

G. E. Jellison, V. I. Merkulov, Alexander A. Puretzky, David B. Geohegan, Gyula Eres, D. H. Lowndes, J. B. O. Caughman
Thin Solid Films

References

YearCitations

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