An improved procedure to calculate the refractive index profile from the measured near-field intensity

Abstract

Refractive index profile of optical waveguides is reconstructed from the measured transmitted near-field intensity. A Butterworth low-pass digital filter is employed in the frequency domain to remove impulsive and high frequency fluctuations which have severe effects on the procedure to calculate the index profile from the measured power intensity. The proposed method has been applied to measure the index profile of monomode optical fiber, Ti:LiNbO/sub 3/ and buried MgTi:LiNbO/sub 3/ channel waveguides.