2003 · 12 citations · 1 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesHeavy-ion PhysicsHigh-frequency Semiconductor DevicesIon Beam IrradiationIon Irradiation DamageIrradiation PerformanceRadiation-tolerant Semiconductor Devices
This paper presents a 4.5 kV diode fabricated using a new ion irradiation technique whereby electrons are replaced by protons in a second irradiation step. The second proton peak is located close to the middle of the n-base. Compared to the combined ion-electron irradiation, diodes with a double proton peak show a smaller maximum reverse-recovery current and a much smoother tail current behavior. The new device has an excellent ruggedness, and is able to withstand a peak power of 1 MW/cm/sup 2/.
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Application-Specific Fast-Recovery Diodes: Design and Performance
N. Galster, Mark Frecker, Eric Carroll et al. · 1998 · 10 citations