Measurement of the x-ray mass attenuation coefficient of silver using the x-ray-extended range technique

Chanh Q. Tran, Christopher T. Chantler, Z. Barnea, Martin D. de Jonge, B. B. Dhal, C. T. Y. Chung, David Paterson, Jingyan Wang

Journal of Physics B Atomic Molecular and Optical Physics · 2004 · 49 citations · 39 references

Concepts

Abstract

We used the x-ray-extended range technique to measure the x-ray mass attenuation coefficients of silver in the 15–50 keV energy range with a level of uncertainty between 0.27% and 0.4% away from the K-edge. The imaginary part of the atomic form factor of silver was derived by subtracting the scattering component from the measured total mass attenuation coefficients. Discrepancies between the measured mass attenuation coefficients and alternative theoretical predictions are discussed.

References

39