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Identification of the possible defect states in poly(3‐hexylthiophene) thin films
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Citations
34
References
2007
Year
EngineeringResponsive PolymersPlastics EngineersLow DensityThin Film Process TechnologyChemistryPolymersPolymer MaterialDefect StatesPolymer ChemistryThin Film ProcessingMaterials ScienceCrystalline DefectsPolymer StabilityOrganic SemiconductorPolymer ScienceApplied PhysicsPolymer PropertyThin FilmsFunctional MaterialsPossible Defect States
Abstract The possible origins of a low density of defect states within the highest occupied molecular orbital to lowest unoccupied molecular orbital gap are suggested for regioregular poly(3‐hexylthiophene). A number of “chemical” defects, impurities, and structural defects could contribute to features in photoemission for regioregular poly(3‐hexylthiophene), observed within the highest occupied molecular orbital to lowest unoccupied molecular orbital gap of regioregular poly(3‐hexylthiophene). POLYM. ENG. SCI., 47:1359–1364, 2007. © 2007 Society of Plastics Engineers
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