Characterization by XPS and XAS of supported Pt/TiO <sub>2</sub> CeO <sub>2</sub> catalysts

A. Dauscher, L. Hilaire, F. Le Normand, Wolfgang Müller, G. Maire, A. Vasquez

Surface and Interface Analysis · 1990 · 99 citations · 14 references

Concepts

Abstract

Abstract TiO 2 and CeO 2 are will known for inducing strong metal‐support interactions J(SMSI) of a different nature when used as supports for Pt catalysts. X‐ray photoelectron spectroscopy analysis of mixtures of TiO 2 CeO 2 oxide supports (80:20 and 20:80) reveals at the surface a remarkable stabilization of cerium in the +3 oxidation state; the stabilization is more pronounced with lower cerium oxide concentration. X‐ray absorption spectroscopy measurements done on the L III edge show the same variation as a function of cerium oxide concentration, but in the bulk the reduction is much lower. Cerium in Pt/TiO 2 CeO 2 catalysts exhibits the same behaviour.

References

14