Thin-film power-density meter for millimeter wavelengths

Abstract

A quasi-optical power density meter for millimeter and submillimeter wavelengths has been developed. The device is a 2-cm/sup 2/ thin-film bismuth bolometer deposited on a mylar membrane. The resistance responsivity is 150 Omega /W, and the time constant is 1 min. The meter is calibrated at DC. The bolometer is much thinner than a wavelength, and can thus be modeled as a lumped resistance in a transmission-line equivalent circuit. The absorption coefficient is 0.5 for 189- Omega /square film. The power-density meter has been used to measure absolute power densities for millimeter-wave antenna efficiency measurements. Absolute power densities of 0.5 mW/cm/sup 2/ have been measured to an estimated accuracy of 5%.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>