Journal of Electron Microscopy · 1998 · 34 citations · 0 references
Natural SciencesMaterials SciencePhysicsElectromagnetismSpectroscopySurface ScienceElectron MicroscopyTransmission Electron MicroscopyContrastScanning Electron MicroscopyScanning Electron Microscopy AnalysisScanning Electron Microscopy Surface Analysis
Journal Article Contrast mechanism of negatively charged insulators in scanning electron microscope Get access Katsumi Ura Katsumi Ura Osaka Sangyou UniversityNakagaito, Daitou, Osaka 574, Japan Search for other works by this author on: Oxford Academic PubMed Google Scholar Journal of Electron Microscopy, Volume 47, Issue 2, 1998, Pages 143–147, https://doi.org/10.1093/oxfordjournals.jmicro.a023571 Published: 01 January 1998 Article history Received: 14 October 1997 Published: 01 January 1998 Accepted: 13 January 1998