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Comprehensive frequency-dependent substrate noise analysis using boundary element methods
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2002
Year
Electrical EngineeringEngineeringNumerical SimulationApplied PhysicsNoiseBoundary Element MethodsComputational ElectromagneticsElectrodynamic ModelingMicroelectronicsSubstrate Noise CouplingSignal ProcessingComprehensive MethodologyNoise ReductionElectromagnetic Compatibility
We present a comprehensive methodology for the electrodynamic modeling of substrate noise coupling. A new and efficient method is introduced for the calculation of the Green's function that can accommodate arbitrary substrate doping profiles and thus facilitate substrate noise analysis using boundary element methods. In addition to a discussion of the application of the method and its validation in the context of substrate transfer resistance extraction, preliminary results from its application to frequency-dependent substrate noise modeling are presented also.
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