Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics · 2003 · 99 citations · 38 references
Natural SciencesMaterials ScienceCondensed Matter PhysicsMultiscale ModelingPattern FormationAvalanche ProcessesCritical PhenomenaFractal GeometryStatistical MechanicsSurface RoughnessSurface Roughness EffectsAvalanche DynamicsCritical ExponentsFinite-size EffectsFinite-size ScalingFractal DimensionSelf-organized CriticalitySelf-organized StructuresSurface Roughening
We present a two-dimensional system that exhibits features of self-organized criticality. The avalanches that occur on the surface of a pile of rice are found to exhibit finite size scaling in their probability distribution. The critical exponents are tau=1.21(2) for the avalanche size distribution and D=1.99(2) for the cutoff size. Furthermore, the geometry of the avalanches is studied, leading to a fractal dimension of the active sites of d(B)=1.58(2). Using a set of scaling relations, we can calculate the roughness exponent alpha=D-d(B)=0.41(3) and the dynamic exponent z=D(2-tau)=1.56(8). This result is compared with that obtained from a power-spectrum analysis of the surface roughness, which yields alpha=0.42(3) and z=1.5(1) in excellent agreement with those obtained from the scaling relations.
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Self-organized criticality: An explanation of the 1/<i>f</i>noise
Per Bak, Chao Tang, Kurt Wiesenfeld · Physical Review Letters · 1987 · 7.6K citations
Dynamic Scaling of Growing Interfaces
Mehran Kardar, Giorgio Parisi, Yi-Cheng Zhang · Physical Review Letters · 1986 · 5.4K citations
Per Bak, Chao Tang, Kurt Wiesenfeld · Physical review. A, General physics · 1988 · 4.7K citations