Publication | Closed Access
Revealing Optical Properties of Reduced‐Dimensionality Materials at Relevant Length Scales
34
Citations
233
References
2015
Year
Optical MaterialsEngineeringTwo-dimensional MaterialsLow Dimensional MaterialOptical CharacterizationSemiconductor NanostructuresIi-vi SemiconductorOptical PropertiesMolecular FoundryReduced-dimensionality MaterialsRelevant Length ScalesNanoscale ScienceLow-dimensional SystemNanophotonicsMaterials SciencePhotonicsPhysicsNanotechnologyPhotonic MaterialsOptoelectronic MaterialsLow-dimensional StructureRelevant Length ScaleOptical PhysicApplied PhysicsOptoelectronics
Reduced-dimensionality materials for photonic and optoelectronic applications including energy conversion, solid-state lighting, sensing, and information technology are undergoing rapid development. The search for novel materials based on reduced-dimensionality is driven by new physics. Understanding and optimizing material properties requires characterization at the relevant length scale, which is often below the diffraction limit. Three important material systems are chosen for review here, all of which are under investigation at the Molecular Foundry, to illustrate the current state of the art in nanoscale optical characterization: 2D semiconducting transition metal dichalcogenides; 1D semiconducting nanowires; and energy-transfer in assemblies of 0D semiconducting nanocrystals. For each system, the key optical properties, the principal experimental techniques, and important recent results are discussed. Applications and new developments in near-field optical microscopy and spectroscopy, scanning probe microscopy, and cathodoluminescence in the electron microscope are given detailed attention. Work done at the Molecular Foundry is placed in context within the fields under review. A discussion of emerging opportunities and directions for the future closes the review.
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