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The capacitive origin of the picosecond electrical transients detected by a photoconductively gated scanning tunneling microscope
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1996
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Transient GratingEngineeringMicroscopyTransient ImagingTunnel ConductanceSemiconductor InterfacesTunneling MicroscopyMicroscopy MethodCapacitive OriginPicosecond Electrical TransientsLight MicroscopyPhotonicsElectrical EngineeringPhysicsTunneling RegimeMicroelectronicsScanning Probe MicroscopyApplied PhysicsOptoelectronics
We present experimental results and numerical calculations on the detection of picosecond electrical transients by a photoconductively gated scanning tunneling microscope. We show that the transient signal detected in the tunneling regime is coupled by the 5 fF geometric capacitance between tip and sample leading to a correlation current that is linearly proportional to the tunnel conductance.