Publication | Closed Access
Analysis of current conduction in short-channel accumulation-mode SOI PMOS devices
18
Citations
19
References
1997
Year
Device ModelingCurrent Conduction MechanismElectrical EngineeringEngineeringElectronic EngineeringBias Temperature InstabilityApplied PhysicsCompact Analytical ModelPower ElectronicsCurrent ConductionMicroelectronicsChannel Length ModulationSemiconductor Device
This paper reports a compact analytical current conduction model for short-channel accumulation-mode SOI PMOS devices. Based on the study, the current conduction mechanism in a short-channel accumulation-mode SOI PMOS device is different from that in a long-channel one. As verified by the experimental data, the compact analytical model considering channel length modulation and prepinchoff velocity saturation gives an accurate prediction of the drain current characteristics.
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