Publication | Closed Access

In situ manipulation of the sub gap states in hydrogenated amorphous silicon monitored by advanced application of Fourier transform photocurrent spectroscopy

EngineeringPhysicsOptical PropertiesSpectroscopySub Gap StatesApplied PhysicsNatural SciencesOptical SpectroscopyAmorphous SiliconPhotoelectric MeasurementSitu ManipulationAmorphous SolidOptoelectronicsSilicon On Insulator