IEEE Transactions on Electron Devices · 1991 · 35 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice ModelingMetal-semiconductor ContactsSemiconductor Device MaterialsSemiconductor SurfacesSilicon MaterialsCurvatureField EmissionOxidationSiliconSilicon Device Materials
A method is described for forming atomically sharp silicon tips of less than 10-15 degrees half-angle by utilizing a known oxidation inhibition at regions of high curvature; equally sharp silicon wedges are now made in a similar fashion. The sharp silicon tips serve as the starting point for forming sharp tips of W, beta -W and gold. Field emission data from silicon emitters are compared with Fowler-Nordheim modelling and emission as a function of emitter-anode distance is described.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Physical properties of thin-film field emission cathodes with molybdenum cones
C.A. Spindt, I. Brodie, L. M. Humphrey et al. · Journal of Applied Physics · 1976 · 1.5K citations
Formation of silicon tips with &lt;1 nm radius
R. B. Marcus, T. S. Ravi, T. J. Gmitter et al. · Applied Physics Letters · 1990 · 261 citations
Simulation and design of field emitters
R. B. Marcus, Ken K. Chin, Yixuan Yuan et al. · IEEE Transactions on Electron Devices · 1990 · 55 citations