Atomically sharp silicon and metal field emitters

R. B. Marcus, T. S. Ravi, T. J. Gmitter, H.H. Busta, J. T. Niccum, Ken K. Chin, D. Liu

IEEE Transactions on Electron Devices · 1991 · 35 citations · 9 references

Concepts

Abstract

A method is described for forming atomically sharp silicon tips of less than 10-15 degrees half-angle by utilizing a known oxidation inhibition at regions of high curvature; equally sharp silicon wedges are now made in a similar fashion. The sharp silicon tips serve as the starting point for forming sharp tips of W, beta -W and gold. Field emission data from silicon emitters are compared with Fowler-Nordheim modelling and emission as a function of emitter-anode distance is described.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

References

9