Publication | Closed Access
Second breakdown—A comprehensive review
125
Citations
32
References
1967
Year
ReliabilitySemiconductor DevicesElectrical EngineeringReliability EngineeringEngineeringComprehensive ReviewPower DeviceNanoelectronicsBias Temperature InstabilityTime-dependent Dielectric BreakdownPower Semiconductor DeviceFailure AnalysisElectronic PackagingSecond BreakdownMicroelectronics
This paper is a comprehensive review of the published literature dealing with the phenomenon of second breakdown in semiconductor devices and the problems it creates in the design, fabrication, testing, and application of transistors.
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