IEEE Transactions on Nuclear Science · 2000 · 132 citations · 10 references
EngineeringComputer EngineeringComputer ScienceComputer ArchitectureFault ToleranceFault-tolerant ComputingError DetectionFault InjectionHardware Fault ToleranceMicroarchitecture DesignMicrocontroller ArchitectureProcessor MicroarchitectureError Rate AnalysisFault Injection In MicroprocessorsFault SimulationHardware Fault DetectionHardware Fault InjectionHardware Fault ModelsMicroarchitectural Fault InjectionMicroarchitecture Emulation
This paper investigates an approach to study the effects of upsets on the operation of microprocessor-based digital architectures. The method is based on the injection of bit-flips, randomly in time and location by using the capabilities of typical application boards. Experimental results, obtained on programs running on two different digital boards, built around an 80C51 microcontroller and a 320C50 Digital Signal Processor, illustrate the potentialities of this new strategy.
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SEU induced errors observed in microprocessor systems
V. Asenek, Craig Underwood, Raoul Velazco et al. · IEEE Transactions on Nuclear Science · 1998 · 34 citations