Microscopy and Microanalysis · 2006 · 14 citations · 0 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsInstrumentationSurface ScienceAnalytical InstrumentationElectron MicroscopyScanning Probe MicroscopySemiconductor DetectorsMicroanalysisMicroscopy ImagingScanning Electron MicroscopyScanning Electron Microscopy Analysis
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006