Controller Design for a Closed-Loop Scanning Tunneling Microscope

Abstract

This paper focuses on controller design for a closed-loop scanning tunneling microscope to deal with fast variations in sample surface. A linear approximation approach is used to deal with non-linearities. The desired performances are then achieved by a controller design based on pole placement with sensitivity function shaping using second order digital notch filters. The corresponding simulation results show better performances than those obtained with PID control techniques.