Publication | Closed Access
Removal of Electrically Active Defects in Silicon by 340 MeV Xe ion Bombardment
13
Citations
4
References
1995
Year
Electrical EngineeringIon ImplantationEngineeringApplied PhysicsSemiconductor Device FabricationElectrically Active DefectsIon EmissionSilicon On InsulatorMicroelectronicsSilicon Debugging
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