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AFM characterization of chitosan self-assembled films
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2002
Year
Afmself-assembledchitosanthin-filmsurface CharacterizationEngineeringMolecular Self-assemblyNanostructured SurfaceSurface NanotechnologyChemistryMaterials FabricationHybrid MaterialsMaterials ScienceNanotechnologyNanomanufacturingAfm CharacterizationSurface ModificationSurface NanoengineeringNanomaterialsNatural SciencesSelf-assemblyMaterials CharacterizationScanning Force MicroscopyPolymer Self-assemblySelf-assembled FilmsNanofabricationFilm Height
Abstract Atomic force microscopy (AFM) was used to examine the surface structure of self-assembled films obtained from water-soluble chitosan rich solution precursor. The film was supported onto functionalized glass slides resulting in a mountain-and-valley structure. This feature is attributed as resulting of the experimental condition where agglomeration of molecules in solution may occur. The film height does not exceed 20 nm with medium pore size of approximately 12 nm. This range of porosity is suitable for nanofiltration applications. Keywords: AfmSelf-assembledChitosanThin-filmSurface Characterization