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Noise behavior of Schottky barrier gate field-effect transistors at microwave frequencies
50
Citations
12
References
1971
Year
Electrical EngineeringNoise Equivalent CircuitMicrowave FrequenciesEngineeringHigh-frequency DeviceRf SemiconductorElectronic EngineeringBias Temperature InstabilityApplied PhysicsCarrier Velocity SaturationNoiseNoise BehaviorMicroelectronicsMicrowave EngineeringSemiconductor Device
The noise behavior of a Schottky barrier gate field-effect transistor is investigated by the use of the noise equivalent circuit. The influence of the carrier velocity saturation is estimated. The noise parameters are calculated by taking into account the influence of parasitic resistances. Measured and calculated noise parameters show good agreement in the frequency range 2-8 GHz.
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