IEEE Transactions on Nuclear Science · 1993 · 86 citations · 25 references
EngineeringAerospace EngineeringPhysicsNuclear PhysicsRadiation PhysicsRadiation ShieldingAccelerator ShieldingCharged Particle ShieldingRadiation HardeningShielding DesignShielding For Particle AcceleratorsShielding MaterialsCharge Transfer EfficiencyDisplacement Damage EffectsMeasurement TechniquesProton ShieldingSecondary Particle ProductionSecondary Radiation ProductionShielding Performance EvaluationTransfer Efficiency
Analysis of monoenergetic proton test data reveals displacement damage degradation of charge transfer efficiency in state-of-the-art charge coupled devices (CCDs). New measurements, in combination with literature data, demonstrate good agreement between the energy dependencies of proton damage and the nonionizing energy loss (NIEL) for protons in Si. Massive shields being considered to preserve CCD performance in satellites are analyzed using the transport code BRYNTRN, which quantifies both primary and secondary particle production. Using NIEL to combine the cumulative effects of both protons and neutrons reaching the CCD. Al and Ta shield approaches are compared for both trapped and flare proton environments. In general, massive Ta shields have diminished benefit owing to damage from large secondary neutron fluxes. Analysis with Shockley-Read-Hall theory demonstrates the importance of CCD operating conditions and transfer efficiency measurement techniques in evaluating flight performance and comparing results between devices and laboratories.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Correlation of Particle-Induced Displacement Damage in Silicon
G.P. Summers, E.A. Burke, C.J. Dale et al. · IEEE Transactions on Nuclear Science · 1987 · 191 citations